Iijima Y., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Imamura K., Kakimoto K., Inoue M.(inoue@ees.kyushu-u.ac.jp), Tokutomi H., Shoyama T.
Tokunaga Y., Izumi T., Aoki Y., Hirabayashi I., Chikumoto N., Matsuda J., Kitoh Y., Machi T.(machi@istec.or.jp)
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, optical imaging, defects, experimental results, fabrication
Tokunaga Y., Izumi T., Machi T., Chikumoto N.(chiku@istec.or.jp), Tajima S.
Iijima Y., Kiss T., Saitoh T., Izumi T., Shiohara Y., Iwakuma M.(iwakuma@sc.kyushu-u.ac.jp), Funaki K., Yamada Y., Nigo M., Inoue D., Miyamoto N.
Sekine N., Miyagi D., Tsukamoto O.(osami@tsukalab.dnj.ynu.ac.jp), Utsunomiya A.
Saitoh T., Teranishi R., Izumi T., Shiohara Y., Fuji H.(hfuji@istec.or.jp), Yamada Y., Matsuda J., Yajima A., Nakaoka K., Kito Y.
Su J.H.(Jianhua.su@wright.edu), Joshi P.P., Chintamaneni V., Mukhopadhyay S.M.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, heating rates, TFA-MOD process, microstructure, resistivity, temperature dependence, fabrication
Ключевые слова: HTS, YBCO, coated conductors, stabilizing layers, substrate Hastelloy, IBAD process, MOCVD process, electroplating process, substrate Ni-W, RABITS process, MOD process, laminations, strain effects, critical current, critical current density, n-value, experimental results, critical caracteristics, fabrication, mechanical properties
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, TFA-MOD process, fabrication, heat treatment, critical current density, phase composition, critical caracteristics
Ключевые слова: HTS, coated conductor modules, substrate Ni-W, buffer layers, MOD process, texture, microstructure, films epitaxial, fabrication
Holzapfel B., Kursumovic A., Evetts J.E., Puig T., Obradors X., Pomar A., Sandiumenge F., Cavallaro A., Huhne R.(r.huehne@ifw-dresden.de)
Ключевые слова: HTS, substrate Ni-Mn, surface oxidation, template layers, buffer layers, PLD process, MOD process, fabrication
Iijima Y., Goto T., Saitoh T., Teranishi R., Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Matsuda J., Yajima A., Yoshinaka A., Nakaoka K., Kitoh Y.
Ключевые слова: HTS, YBCO, films large-area, substrate sapphire, buffer layers, MOD process, critical current, fabrication, critical caracteristics
Ключевые слова: HTS, YBCO, films epitaxial, substrate sapphire, buffer layers, MOD process, microstructure, critical current density, critical caracteristics, fabrication
Puig T., Palau A., Obradors X., Pomar A., Sandiumenge F., Pinol S., Mestres N., Castano O., Coll M., Cavallaro A., Gazquez J., Gonzalez J.C., Gutierrez J., Roma N., Ricart S., Moreto J.M., Rossell M.D., Tendeloo G.V.
Iijima Y., Saitoh T., Teranishi R., Tokunaga Y., Fuji H., Asada S., Izumi T., Shiohara Y., Kaneko A., Honjo T., Matsuda J.S.(jmatsuda@istec.or.jp), Yajima A.
Ключевые слова: HTS, YBCO, coated conductors, microstructure, heat treatment, TFA-MOD process, fabrication, substrate Hastelloy, IBAD process
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.